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Title:
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USING TEST-DRIVEN DEVELOPMENT IN A PARSE-TREE BASED ON-LINE ASSESSMENT SYSTEM |
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Author(s):
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Li-ren Chien , Daniel J. Buehrer , Chin Yi Yang |
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ISBN:
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978-972-8924-42-3 |
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Editors:
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Miguel Baptista Nunes and Maggie McPherson (series editors: Piet Kommers, Pedro Isaías and Nian-Shing Chen) |
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Year:
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2007 |
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Edition:
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V I, 2 |
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Keywords:
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DICE, Test-Driven Development, Test-based Grader, Parse-Tree based, Automatic Grading, Computer Aided
Assessments. |
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Type:
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Full Paper |
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First Page:
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342 |
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Last Page:
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350 |
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Language:
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English |
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Cover:
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Full Contents:
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click to dowload 
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Paper Abstract:
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DICE is a parse-tree-based on-line computer aided assessment system that has been used for several years to
help teach computer programming language courses at Hsing Kuo High School in Taiwan. We need a more
sophisticated testing mechanism for the underachievers. This paper describes the use of test-driven
development (TDD) as an extension of our DICE system. The DICE system was used to access studentwritten
code, which was graded by comparing the output against instructor-given answer. This extension
gives us the ability to make a TDD test unit by the instructor, co-learner or student her/himself. We expect
the new functionality can prompt the underachievers to improve their programming ability. |
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