Title:	VALIDITY AND RELIABILITY OF VISUAL ANALOGUE SCALE CONSTRUCTS MEASURING STRATEGIC INFORMATION SYSTEMS PLANNING
Author(s):	Luka M. Musangu, Ray M. Kekwaletswe, Alfred Coleman
ISBN:	978-972-8939-73-1
Editors:	Miguel Baptista Nunes, Guo Chao Peng, Jörg Roth, Hans Weghorn and Pedro Isaías
Year:	2012
Edition:	Single
Keywords:	SISP, VAS, Validity, Reliability, EFA, Rasch model.
Type:	Full Paper
First Page:	18
Last Page:	28
Language:	English
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Full Contents:	click to dowload
Paper Abstract:	Strategic Information Systems Planning (SISP) is challenging to measure because it is a multidimensional phenomenon that involves SISP process, SISP context and SISP success. All SISP previous quantitative researches have used LIkert scale and the use of Visual Analogue Scale (VAS) in Management Information Systems (MIS) is noticeably absent. This paper purpose was simultaneously to adapt existing instruments from Likert scale to visual analogue scale and evaluate the validity and reliability of those constructs in the context of South Africa Small Business. Data was collected from 319 CIOs in South Africa small businesses (SBs). Exploratory factor analysis (EFA) was performed to assess construct validity and construct reliability was measured using Rasch model analysis. EFA results reveal that from 66 selected items, 15 items were dropped and 51 items were retained. Rasch model analysis indicates that the reliability for all constructs were higher than the acceptable level for person and item. Cronbach alpha for person was ranged from .94 to .96 and item was ranged from .93 to .94. The research findings provide evidence that the use VAS can help SISP researchers to improve reliability and responsiveness. The adaptation of Likert scale items to VAS provide survey respondents with more opportunities and give researcher alternative to use either parametric or non-parametric test.
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